VNA - High frequency complex dielectric permittivity and magnetic permeability measurements MS(SPI) - Low frequency MS measurements with Sapphire Insturments system MS(Bart) - Low frequency MS measurements with Barington Insturments system MS(GeoMus) - Low frequency MS measurements of CSM Geology Museums samples with Sapphire Insturments system MS(LCR) - Low frequency MS measurements with custom LCR system MS(LFD) - Low frequency MS measurements with the custom low frequency device XRD - X-Ray Diffraction characterization |